A Built-In Self-Test Circuit Based on March FRDD Algorithm for FinFET Memory

FinFET memory is widely used in various semiconductor products due to its good read/write margin, lower power consumption, and faster driving speed. However, the forked 3D physical structure increased density of storage are very susceptible manufacturing defects, which may cause functional logic faults that different from traditional planar CMOS memories. Therefore, it critical explore an effective test method for This paper proposes a MBIST circuit detecting memory. The proposed based on March FRDD algorithm performs well resistance dynamic faults. area this 85.3286 µm2, benefits design multiplexing internal part circuit. total fault coverage reaches 91.7%, provides great convenience testing.